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Low-temperature epitaxial growth of [Fe$$_{3}$$Si/SiGe]$$_{n}$$ (n = 1-2) multi-layered structures for spintronics application

Sado, Taizo*; Ueda, Koji*; Ando, Yuichiro*; Kumano, Mamoru*; Narumi, Kazumasa; Maeda, Yoshihito; Miyao, Masanobu*

Our recent progresses in epitaxial growth of Fe$$_{3}$$Si on Ge substrates are reviewed. Single crystalline Fe$$_{3}$$Si layers with atomically flat interfaces were achieved on Ge(111) substrates by optimizing growth conditions at low temperatures (60$$sim$$200 $$^{circ}$$C). Thermal stability of it was guaranteed up to 400 $$^{circ}$$C. In addition, epitaxial growth of mixed layers composed of Fe$$_{3}$$Si, FeGe, and FeSi on Ge substrates at 400 $$^{circ}$$C is reported. Finally, epitaxial growth of Fe$$_{3}$$Si/Ge/Fe$$_{3}$$Si/Ge structures is discussed. These results will be a powerful tool to open up SiGe related spintronics.

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