Bond cleavages of adenosine 5'-triphosphate induced by monochromatic soft X-rays

藤井 健太郎; 成田 あゆみ; 横谷 明徳

Fujii, Kentaro; Narita, Ayumi; Yokoya, Akinari

軟X線照射によって誘発されるアデノシン三リン酸(ATP)分子の分子結合切断をX線吸収分光により明らかにした。ATP薄膜に炭素,窒素および酸素K殻イオン化閾値よりも高いエネルギーの軟X線を照射し、照射前後のX線吸収端近傍微細構造(XANES)スペクトルを測定した。その結果、照射によって、糖部位のペントース環内のC-O結合が切断すること、塩基あるいはアデノシン一リン酸(AMP)が遊離することが明らかになった。

In order to clarify the unoccupied electronic structure exposed to soft X-rays, we measured XANES spectrum of adenosine 5'-triphosphate (ATP) before and after irradiation. Experiments were performed at soft X-ray beamline BL23SU in SPring-8. We observed the spectral changes of the resonant peak near nitrogen and oxygen K-ionization thresholds by an irradiation with 560 eV photons which is above oxygen ionization potential. Irradiated samples were also analyzed by electrochemistry and mass spectrometry. Decomposition patterns of ATP exposed to soft X-ray will be discussed from these results.