Nanoscale chemical analysis on microparticles by using soft X-ray photoemission electron microscope

Yoshigoe, Akitaka 

A synchrotron radiation photoemission electron microscope (SR-PEEM) probing photoelectrons emitted from samples is an useful microscope with surface sensitive and nanoscale spatial resolution. The electron lens-system facilitates the enlargement and reduction of the sample image, and enables pinpoint chemical analysis by high energy resolution X-ray absorption spectroscopy (XAS). It has many advantages over scanning and transmission microscopes because it can observe samples without any preparations such as reduction of the sample thickness. In this talk, an application of SR-PEEM for elucidation of the adsorption states of radioactive Cs in clay minerals due to 1F accident will be shown. To overcome insulating properties of clay, an thin film was deposited on the sample surface. After this treatment. clear Cs map and pinpoint XAS spectra for Cs M-edge XAS for weathered biotite clay minerals with Cs were obtained to giving important findings on Cs adsorption mechanism. This method is expected to be applicable for not only the nuclear power researches, but also studies on nanotechnologies.