Development of spin-contrast-variation neutron reflectometry for structural analysis of multilayer films

多層膜材料の構造解析に向けたスピンコントラスト変調中性子反射率法の開発

熊田 高之   ; 阿久津 和宏*; 三浦 大輔*; 鈴木 淳市*; 鳥飼 直也*

Kumada, Takayuki; Akutsu, Kazuhiro*; Miura, Daisuke*; Suzuki, Junichi*; Torikai, Naoya*

The spin-contrast-variation neutron reflectometry technique was developed for the structural analysis of multilayer films. Polarized-neutron reflectivity curves of film samples vary according to their proton polarization (PH). The PH-dependent reflectivity curves of a polystyrene monolayer film were precisely reproduced using a common set of structural parameters and the PH-dependent neutron scattering length density of polystyrene. Unpolarized reflectivity curves of poly(styrene-block-isoprene) films were reproduced a lot of models. But, the global fit of the PH-dependent multiple reflectivity curves severely restrict the models.