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Ishida, Takekazu*; Vu, TheDang*; Shishido, Hiroaki*; Aizawa, Kazuya; Oku, Takayuki; Oikawa, Kenichi; Harada, Masahide; Kojima, Kenji M*; Miyajima, Shigeyuki*; Koyama, Tomio*; et al.
Journal of Low Temperature Physics, 214(3-4), p.152 - 157, 2024/02
Times Cited Count:0 Percentile:0.01(Physics, Applied)Shishido, Hiroaki*; Vu, TheDang*; Aizawa, Kazuya; Kojima, Kenji M*; Koyama, Tomio*; Oikawa, Kenichi; Harada, Masahide; Oku, Takayuki; Soyama, Kazuhiko; Miyajima, Shigeyuki*; et al.
Journal of Applied Crystallography, 56(4), p.1108 - 1113, 2023/08
Times Cited Count:0 Percentile:0.02(Chemistry, Multidisciplinary)Nakae, Masanori*; Matsuyama, Tsugufumi*; Murakami, Masashi; Yoshida, Yukihiko; Machida, Masahiko; Tsuji, Koichi*
Advances in X-Ray Chemical Analysis, Japan, 54, p.89 - 99, 2023/03
Fundamental research on X-ray absorption imaging for elemental identification was studied. A secondary target was applied to obtain X-ray absorption images above and below the X-ray absorption edge of the target element. X-rays from an X-ray tube were irradiated to the secondary target, where the characteristic X-rays were emitted that were irradiated to the sample. X-ray absorption images were acquired with an exposure time of a few seconds with an X-ray camera. In this technique, it is difficult to change the energy of X-rays as we want, however we can apply this technique for imaging the specific element. Metal foil sample composed of Al, Cu, and Ni was analyzed. To obtain an X-ray elemental image of Ni, two X-ray absorption images were taken using the X-rays above and below the Ni K-edge. X-rays of Cu K and Zn K were prepared by using Cu and Zn plates as the secondary target. Finally, the Ni elemental image was obtained by subtracting two images. Furthermore, the X-ray camera had a function of setting critical energies for imaging, thus it was demonstrated that an X-ray elemental image of Ni was obtained using a single secondary target without changing the secondary target.
Matsuyama, Tsugufumi*; Nakae, Masanori*; Murakami, Masashi; Yoshida, Yukihiko; Machida, Masahiko; Tsuji, Koichi*
Spectrochimica Acta, Part B, 199, p.106593_1 - 106593_6, 2023/01
Times Cited Count:2 Percentile:41.58(Spectroscopy)Arai, Yoichi; Hasegawa, Kenta; Watanabe, So; Watanabe, Masayuki; Minowa, Kazuki*; Matsuura, Haruaki*; Hagura, Naoto*; Katsuki, Kenta*; Arai, Tsuyoshi*; Konishi, Yasuhiro*
Journal of Radioanalytical and Nuclear Chemistry, 9 Pages, 2023/00
Times Cited Count:0 Percentile:0.01(Chemistry, Analytical)Miyagawa, Reina*; Kamibayashi, Daisuke*; Nakamura, Hirotaka*; Hashida, Masaki*; Zen, H.*; Somekawa, Toshihiro*; Matsuoka, Takeshi*; Ogura, Hiroyuki*; Sagae, Daisuke*; Seto, Yusuke*; et al.
Scientific Reports (Internet), 12, p.20955_1 - 20955_8, 2022/12
Times Cited Count:0 Percentile:0(Multidisciplinary Sciences)We evaluated Laser-Induced Periodic Surface Structure (LIPSS) crystal structures using the stress imaging station at BL22XU of JAEA-BL on SPring-8. Crystallization of LIPPS was used different two types laser these are Ti:Sapphire laser (wavelength: 800 nm) and MIR-FEL (mid-infrared free electron laser, wavelength 11.4 m). These lasers are different in the laser pulse structure and the wavelength. We investigated on the effects of formed LIPSS crystallization using different kind of laser. Measured synchrotron X-ray energy is 30 keV and beam size is 20 m. Detector of diffracted X-ray is two-dimensional detector (PILATUS300K, DECTRIS). LIPSS formed using Ti:Sapphire laser has deformed structure with good crystallinity. LIPSS formed using MIR-FEL has dislocation or fault without structural stress. These results show depending on select of laser forming LIPPS structure. These information becomes important a point of the functional application of LIPSS.
Ishii, Yui*; Yamamoto, Arisa*; Sato, Naoki*; Nambu, Yusuke*; Kawamura, Seiko; Murai, Naoki; Ohara, Koji*; Kawaguchi, Shogo*; Mori, Takao*; Mori, Shigeo*
Physical Review B, 106(13), p.134111_1 - 134111_7, 2022/10
Times Cited Count:0 Percentile:0(Materials Science, Multidisciplinary)Matsuyama, Tsugufumi*; Nakae, Masanori*; Murakami, Masashi; Yoshida, Yukihiko; Machida, Masahiko; Tsuji, Koichi*
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no abstracts in English
Machida, Masahiko; Murakami, Masashi; Yoshida, Yukihiko; Sasaki, Toshiki; Tanimura, Naoki*
no journal, ,
no abstracts in English