Observation of oriented organic semiconductor using Photo-Electron Emission Microscope (PEEM) with polarized synchrotron

Sekiguchi, Tetsuhiro; Baba, Yuji; Hirao, Norie; Honda, Mitsunori; Izumi, Toshinori; Ikeura, Hiromi*

Molecular Crystals and Liquid Crystals, 622(1), p.44 - 49, 2015/12

BB2014-1632.pdf:0.71MB

https://doi.org/10.1080/15421406.2015.1096989

The molecular orientation is one of the important factors for controlling various properties in organic semiconductor materials. Films are usually heterogeneous. Thus they exist as a mixture of microscopic domains which have a variety of orientation directions. Therefore, it is essential to observe selectively microscopic domains with different orientation direction. In this work, we have developed the photoelectron emission microscopy (PEEM) system combined with the linearly polarized vacuum ultraviolet (VUV) light or synchrotron radiation (SR) X-rays. PEEM images (FOV = ca.50 micro m) for poly(3-hexylthiophene), P3HT thin films were observed under the UV irradiation with various polarization angles, including in-plain and out-of-plain polarization. Morphologies at some bright parts are different each other. The resultant observation suggests that it enables us to distinguish oriented micro-domains with specific directions of polymer chain axis from other amorphous parts.

Use of emanation thermal analysis in charcterization of leached surface of perovskite ceramics containing simulated TRU elements

V.Balek*; Z.Malek*; Mitamura, Hisayoshi; Bamba, Tsunetaka

Proc. of 7th Int. Conf. on Radioactive Waste Management and Environmetnal Remediation (ICEM'99)(CD-ROM), 4 Pages, 1999/00

no abstracts in English

None

Nemoto, Takeshi; Ouchi, Jin; Okada, Takashi; Kondo, Isao;

PNC TN8410 92-019, 40 Pages, 1992/02

PNC-TN8410-92-019.pdf:2.65MB

None

Distribution of radioactive waste elements among constituent minerals of a ceramic waste form

Mineral.J., 11(7), p.344 - 351, 1983/00

no abstracts in English