Structural and gasochromic properties of WO films prepared by reactive sputtering deposition

Yamamoto, Shunya; Hakoda, Teruyuki; Miyashita, Atsumi; Yoshikawa, Masahito

Materials Research Express (Internet), 2(2), p.026401_1 - 026401_8, 2015/02

https://doi.org/10.1088/2053-1591/2/2/026401

The effects of deposition temperature and film thickness on the structural and gasochromic properties of tungsten trioxide films used for the optical detection of diluted cyclohexane have been investigated. The tungsten trioxide films were prepared on SiO substrates by magnetron sputtering, with the deposition temperature ranging from 300 to 550C in an Ar and O gas mixture. The gasochromic properties of the films, coated with a catalytic Pt layer, were examined by exposing them up to 5% cyclohexane in N gas. We found that (001)-oriented monoclinic tungsten trioxide films, with a columnar structure, grew at deposition temperatures between 400 and 450C. The gasochromic characterization of the tungsten trioxide films revealed that (001)-oriented tungsten trioxide films, with cauliflower-like surface morphology, were appropriate for the optical detection of cyclohexane.