JOPSS - Search Results

Journal Articles

Negative and positive muon-induced single event upsets in 65-nm UTBB SOI SRAMs

Manabe, Seiya*; Watanabe, Yukinobu*; Liao, W.*; Hashimoto, Masanori*; Nakano, Keita*; Sato, Hikaru*; Kin, Tadahiro*; Abe, Shinichiro; Hamada, Koji*; Tampo, Motonobu*; et al.

IEEE Transactions on Nuclear Science, 65(8), p.1742 - 1749, 2018/08

https://doi.org/10.1109/TNS.2018.2839704

Times Cited Count：9 Percentile：66.49(Engineering, Electrical & Electronic)

Recently, the malfunction of microelectronics caused by secondary cosmic-ray muon is concerned as semiconductor devices become sensitive to radiation. In this study, we have performed muon irradiation testing for 65-nm ultra-thin body and thin buried oxide (UTBB-SOI) SRAMs in the Japan Proton Accelerator Research Complex (J-PARC), in order to investigate dependencies of single event upset (SEU) cross section on incident muon momentum and supply voltage. It was found that the SEU cross section by negative muon are approximately two to four times larger than those by positive muon in the momentum range from 35 MeV/c to 39 MeV/c. The supply voltage dependence of muon-induced SEU cross section was measured with the momentum of 38 MeV/c. SEU cross sections decrease with increasing supply voltage, but the decreasing of SEU cross section by negative muon is gentler than that by positive muon. Experimental data of positive and negative muon irradiation with the momentum of 38 MeV/c were analyzed by PHITS. It was clarified that the negative muon capture causes the difference between the SEU cross section by negative muon and that by positive muon.

Journal Articles

Degradation of cable insulation material by accelerated thermal radiation combined ageing

Seguchi, Tadao*; Tamura, Kiyotoshi*; Kudo, Hisaaki*; Shimada, Akihiko; Sugimoto, Masaki

IEEE Transactions on Dielectrics and Electrical Insulation, 22(6), p.3197 - 3206, 2015/12

https://doi.org/10.1109/TDEI.2015.004880

Times Cited Count：28 Percentile：76.36(Engineering, Electrical & Electronic)

The degradation of ethylene propylene rubber (EPR) sheets as a cable insulation material for nuclear power plants (NPP) was studied by accelerated thermal ageing, radiation ageing and thermal - radiation combined ageing. The oxidation of EPR proceeded with ageing and the decay of mechanical property was closely related to the content of oxidation products. The antioxidant as a stabilizer in EPR was effective for the thermal oxidation, but not for the radiation oxidation. For the thermal and radiation combined oxidation, the mechanical property and the content of oxidation products were different among the treatment sequences due to the decay of antioxidant. The lifetime of EPR cable is closely related to the remaining content of antioxidant, and the lifetime evaluation would be recommended by the reverse sequential combination (thermal ageing after radiation ageing).

Journal Articles