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Journal Articles

Application of high-energy synchrotron-radiation X-ray photoelectron spectroscopy to the depth profile analysis of oxide layer on Si(100) surfaces

Yamamoto, Hiroyuki; Baba, Yuji; Sasaki, Teikichi

Bunseki Kagaku, 45(2), p.169 - 174, 1996/00

https://doi.org/10.2116/bunsekikagaku.45.169
 Times Cited Count：2 Percentile：10.64(Chemistry, Analytical)

no abstracts in English

Journal Articles

Application of high-energy synchrotron-radiation XPS to determine the thickness of SiO$$_{2}$$ thin films on Si(100)

Yamamoto, Hiroyuki; Baba, Yuji; Sasaki, Teikichi

Surface Science, 349, p.L133 - L137, 1996/00

https://doi.org/10.1016/0039-6028(95)01332-6
 Times Cited Count：26 Percentile：80.77(Chemistry, Physical)

no abstracts in English

Journal Articles

Oxide-film thickness measurements by high-energy XPS

Yamamoto, Hiroyuki; Baba, Yuji; Sasaki, Teikichi

Photon Factory Activity Report, P. 366, 1995/00

no abstracts in English

JAEA Reports

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Kawamura, Kazuhiro

PNC TN8600 92-001, 86 Pages, 1992/01

PNC-TN8600-92-001.pdf:4.7MB

no abstracts in English

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