Recrystallization by annealing in SiC amorphized with Ne irradiation

Aihara, Jun ; Hojo, Kiichi; Furuno, Shigemi*; Ishihara, Masahiro ; Hayashi, Kimio

no abstracts in English

Language	:	English
Journal	:	Journal of Electron Microscopy
Volume	:	51
Number	:	2
Pages	:	p.93 - 98
Publication Year/Month	:	2002/05
Meeting title	:	12th International Conference on the Ion Beam Modification of Materials
Held date	:	2000/09
Location (city)	:	Porto Alegre
Location (country)	:	Brazil
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1093/jmicro/51.2.93
DOI for research data	:
Keywords	:	炭化珪素; イオン照射; 焼鈍; 再結晶化; 不活性ガス; 核生成; 非晶質
Research Facility	:
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Article of JAEA R&D Review	:
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Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:20.46 Category:Microscopy
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Registration No. : B20001457
JAEA Abstracts No. : 300873
Paper Submission No. : 19339

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