The Development of a new data collection system and chamber for transient ion beam and laser beam induced current measurements as a function of temperature

Laird, J. S.; Hirao, Toshio; Mori, Hidenobu*; Onoda, Shinobu*; Ito, Hisayoshi

no abstracts in English

Language	:	English
Journal	:	Proceedings of 4th International Workshop on Radiation Effects on Semiconductor Devices for Space Application
Volume	:
Number	:
Pages	:	p.97 - 102
Publication Year/Month	:	2000/00
Meeting title	:	4th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications
Held date	:	2000/10
Location (city)	:	Tsukuba
Location (country)	:	Japan
Patent information	:
PDF	:
Paper URL	:
DOI for research data	:
Keywords	:	シングルイベント; IBIC; LBIC; レーザ; マッピング; 温度; マイクロビーム
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:
Altmetrics	:

Registration No. : B20001497
JAEA Abstracts No. : 290327
Paper Submission No. : 17989

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.