Development of quick-response area-averaged void fraction meter; Application to BWR condition

Iguchi, Tadashi; Watanabe, Hironori; Kimura, Mamoru*; Anoda, Yoshinari

no abstracts in English

Language	:	Japanese
Report No.	:	JAERI-Research 2001-032
Pages	:	111 Pages
Publication Year/Month	:	2001/05
Patent information	:
PDF	:	JAERI-Research-2001-032.pdf:4.14MB
Paper URL	:	https://doi.org/10.11484/jaeri-research-2001-032
DOI for research data	:	Link to research data related to this paper/report.
Keywords	:	Area-averaged Void Fraction; Quick Response; Application to BWR; Conductance Void Fraction Meter; Temperature Dependency; Capacitance; Rod Bundle
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:
Other institute's report number	:

Acecsses	:	- Accesses

Registration No. : S20010032
JAEA Abstracts No. : 290620

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