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Detection of internal defect in materials by infrared thermography and its numerical simulation; Effect of thermal diffusivity of materials on defect detection

Ishii, Toshimitsu; Inagaki, Terumi*; Sakane, Taisuke*; Nakatani, Takahiko*; Ooka, Norikazu; Omi, Masao; Hoshiya, Taiji

no abstracts in English

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