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Report No.
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Characterization of epitaxial TiO$$_{2}$$ films prepared by pulsed laser deposition

Yamamoto, Shunya; Sumita, Taishi; Yamaki, Tetsuya; Miyashita, Atsumi; Naramoto, Hiroshi

The epitaxial growth of TiO$$_{2}$$ films has attracted much interest from the viewpoints of basic science and applications. In the present study, it is shown that TiO$$_{2}$$ films with anatase or rutile structure can be grown by pulsed laser deposition(PLD) with an ArF excimer laser under the controlled O$$_{2}$$ atmosphere. The TiO$$_{2}$$ films were prepared on the LaAlO$$_{3}$$, LSAT SrTiO$$_{3}$$ and $$alpha$$-Al$$_{2}$$O$$_{3}$$ single crystal substrates. The epitaxial films were analyzed by RBS and X-ray diffraction for investigating the crystallographic relationships with the substrates. The high quality anatase TiO$$_{2}$$(001) films have been successfully grown on the LaAlO$$_{3}$$ (001), LSAT (001) and SrTiO$$_{3}$$ (001) substrates at temperatures above 500$$^{circ}$$C. Also the high quality rutile TiO$$_{2}$$(100) and (001) films were obtained on the $$alpha$$-Al$$_{2}$$O$$_{3}$$ (0001) and (10-10), respectively.The optical properties were characterized by optical absorption measurements. The optical band gaps for anatase and rutile TiO$$_{2}$$ epitaxial films were evaluated to be 3.22 eV and 3.11 eV, respectively.

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