Research of single-event burnout in bipolar transistors

Hirao, Toshio; Shindo, Hiroyuki*; Kuboyama, Satoshi*; Nagai, Yuki*; Ohira, Hideharu*; Ito, Hisayoshi; Matsuda, Sumio*

no abstracts in English

Language	:	Japanese
Journal	:	JNC TN7200 2001-001
Volume	:
Number	:
Pages	:	p.66 - 68
Publication Year/Month	:	2002/01
Meeting title	:	第14回タンデム加速器及びその周辺技術の研究会
Held date	:	2001/06
Location (city)	:	土岐
Location (country)	:	日本
Patent information	:
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Paper URL	:
DOI for research data	:
Keywords	:	SEB; SEP; MOSFET; バイポーラトランジスタ
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Article of JAEA R&D Review	:
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Registration No. : B20010572
JAEA Abstracts No. :
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