Application of thin film dosimeters to measurement of ion beam dose distribution, 2

Kojima, Takuji; Sunaga, Hiromi; Takizawa, Haruki; Hanaya, Hiroaki; Tachibana, Hiroyuki

Gafchromic film (MD-1260) characterized for MeV/u ion beams was tested for measurement of the lateral distribution profiles in the plastic phantom. Gafchromic film was irradiated to 120 Gy using 450 MeV $^{129}$ Xe $^{23+}$ ions through the 10 thick mesh mask having 6 m line-width and 19 inner latice distance to make artificial dose distribution on the film. Analysis of radiation-induced color change of the film was tried using a microscopic spectrophotpmeter having 1 dia. analyzing light. The film has a potencial to know exact lateral irradiation area with sufficient sharpness and dose distribution by converting absorbance to dose on he basis of dose response characteristics, with spatial resolution of 1.

Language	:	English
Journal	:	JAERI-Review 2001-039, TIARA Annual Report 2000
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Pages	:	p.120 - 121
Publication Year/Month	:	2001/11
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Paper URL	:	https://doi.org/10.11484/jaeri-review-2001-039
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Keywords	:	Ion Beam; Dosimetry; Dose Distribution; Spatial Resolution; Gafchromic Film; Microscopic Spectrophotometer
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Registration No. : A20010306
JAEA Abstracts No. :
Paper Submission No. : 21006

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