Simulation on neoclassical tearing mode stabilization by ECCD for JT-60 superconducting tokamak

Hayashi, Nobuhiko; Ozeki, Takahisa; Hamamatsu, Kiyotaka; Takizuka, Tomonori

Stabilizing simulation of the neoclassical tearing mode by an electron cyclotron current drive (ECCD) in JT-60 superconducting tokamak has been done by using a 1.5D time-dependent tokamak code TOPICS and the modified Rutherford's equation. A local EC current in the center of the island stabilizes the mode. However, the EC current off the center moves the rational surface and decreases the stabilizing effect of EC. Necessary range of EC current location for the stabilization becomes wider for low EC power, or narrower for high EC power, when the EC current profile is more peaked. The long duration of EC injection widens this range. Peaked EC current profile, early injection and long injection duration lower the minimum EC power necessary for the stabilization.

Language	:	English
Journal	:	Journal of Plasma and Fusion Research SERIES, Vol.5
Volume	:
Number	:
Pages	:	p.519 - 522
Publication Year/Month	:	2002/00
Meeting title	:	Joint Conference of The 12th International Toki Conference on Plasma Physics and Controlled Nuclear Fusion (ITC-12) and The 3rd General Scientific Assembly of Asia Plasma Fusion Association (APFA '01)
Held date	:	2001/12
Location (city)	:	Toki
Location (country)	:	Japan
Patent information	:
PDF	:
Paper URL	:
DOI for research data	:
Keywords	:	Neoclassical Tearing Mode; Electron Cyclotron Current Drive; Simulation; Stabilization; Tokamak
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:
Altmetrics	:

Registration No. : B20011508
JAEA Abstracts No. : 310704
Paper Submission No. : 20218

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.