Real-time stress/strain measurement during growth of Sr and SrO epilayer on H-terminated Si

Asaoka, Hidehito ; Machida, Yusuto; Yamamoto, Hiroyuki; Hojo, Kiichi; Saiki, Koichiro*; Koma, Atsushi*

no abstracts in English

Language	:	English
Journal	:	Thin Solid Films
Volume	:	433
Number	:	1-2
Pages	:	p.140 - 143
Publication Year/Month	:	2003/06
Meeting title	:	12th International Conference on Thin Films (ICTF-12)
Held date	:	2002/09
Location (city)	:	Bratislava
Location (country)	:	Slovakia
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1016/S0040-6090(03)00305-5
DOI for research data	:
Keywords	:	3次元ナノ; 薄膜; エピタキシャル成長; 単結晶; 内部応力
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
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Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:15.16 Category:Materials Science, Multidisciplinary
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Registration No. : B20011967
JAEA Abstracts No. : 310960
Paper Submission No. : 20443

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