High-energy X-ray diffraction studies of short- and intermediate-range structure in oxide glasses

Suzuya, Kentaro; Kohara, Shinji*

With the arrival of the latest generation of synchrotron sources and the introduction of advanced insertion devices, the high-energy (E 30 keV) X-ray diffraction technique has become feasible, leading to new approaches in the quantitative study of the structure of disordered materials. Recently, the high-energy X-ray diffraction data have been combined with neutron diffraction data from a pulsed source to provide more detailed and reliable structural information than that hitherto available. We have developed a two-axis diffractometer for glass, liquid and amorphous materials at the SPring-8 high-energy X-ray diffraction beamline BL04B2. Furthermore, we have succeeded to analyze the intermediate-range order of network forming glasses, SiO, BO, and GeO by the reverse Monte Carlo (RMC) modelling technique with special focused on the ring structures using both high-energy X-ray and neutron diffraction data.