Design of a focusing high-energy heavy ion microbeam system at the JAERI AVF cyclotron

Oikawa, Masakazu*; Kamiya, Tomihiro; Fukuda, Mitsuhiro; Okumura, Susumu; Inoue, Hiromitsu*; Masuno, Shinichi*; Umemiya, Shinsuke*; Oshiyama, Yoshifumi*; Taira, Yutaka*

no abstracts in English

Language	:	English
Journal	:	Nuclear Instruments and Methods in Physics Research B
Volume	:	210
Number	:	1-4
Pages	:	p.54 - 58
Publication Year/Month	:	2003/09
Meeting title	:	8th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA 2002)
Held date	:	2002/09
Location (city)	:	Takasaki
Location (country)	:	Japan
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1016/S0168-583X(03)01007-3
DOI for research data	:	Link to research data related to this paper/report.
Keywords	:	Microbeam; Single Ion Hit; Quadruplet Quadrupole Electromagnet; TIARA; AVF Cycrotron
Research Facility	:	TIARA(イオン照射研究施設)
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

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Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:82.76 Category:Instruments & Instrumentation
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Registration No. : B20020464
JAEA Abstracts No. : 320108
Paper Submission No. : 20642

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