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Design of a focusing high-energy heavy ion microbeam system at the JAERI AVF cyclotron

Oikawa, Masakazu*; Kamiya, Tomihiro; Fukuda, Mitsuhiro; Okumura, Susumu; Inoue, Hiromitsu*; Masuno, Shinichi*; Umemiya, Shinsuke*; Oshiyama, Yoshifumi*; Taira, Yutaka*

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Category:Instruments & Instrumentation

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