XAS and XPS combined analysis using high-resolution and high-flux soft X-ray from synchrotron radiation

Matsubayashi, Nobuyuki*; Tanaka, Tomoaki*; Imamura, Motoyasu*; Shimada, Hiromichi*; Saito, Takeru

no abstracts in English

Language	:	English
Journal	:	Analytical Sciences (CD-ROM)
Volume	:	17
Number	:	Suppl.
Pages	:	p.119 - 121
Publication Year/Month	:	2002/03
Meeting title	:	International Congress on Analytical Sciences 2001 (ICAS 2001)
Held date	:	2001/08
Location (city)	:	Tokyo
Location (country)	:	Japan
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Keywords	:	放射光; XPS; XAS; 高強度; 高分解能; 電子構造
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Registration No. : B20020426
JAEA Abstracts No. : 300779
Paper Submission No. : 19257

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