Analysis of failure caused by cosmic rays in high-voltage high-power semiconductor devices, 2

Matsuda, Hideo*; Omura, Ichiro*; Sakiyama, Yoko*; Urano, Satoshi*; Iesaka, Susumu*; Ohashi, Hiromichi*; Hirao, Toshio; Abe, Hiroshi; Ito, Hisayoshi; Mori, Hidenobu; Onoda, Shinobu

no abstracts in English

Language	:	English
Journal	:	JAERI-Review 2002-035, TIARA Annual Report 2001
Volume	:
Number	:
Pages	:	p.11 - 13
Publication Year/Month	:	2002/11
Meeting title	:	第11回TIARA研究発表会
Held date	:	2002/07
Location (city)	:	高崎
Location (country)	:	日本
Patent information	:
PDF	:
Paper URL	:
DOI for research data	:
Keywords	:	電力半導体素子; 宇宙線; プロトン照射; 絶縁破壊
Research Facility	:	TIARA(イオン照射研究施設)
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:	東芝セミコンダクター社

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Registration No. : B20020521
JAEA Abstracts No. :
Paper Submission No. : 25667

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