Observation of single-ion induced charge collection in diode by a heavy ion microbeam system

Kamiya, Tomihiro; Oikawa, Masakazu*; Oshima, Takeshi; Hirao, Toshio; Lee, K. K.; Onoda, Shinobu*; Laird, J. S.

no abstracts in English

Language	:	English
Journal	:	Nuclear Instruments and Methods in Physics Research B
Volume	:	210
Number	:
Pages	:	p.206 - 210
Publication Year/Month	:	2003/09
Meeting title	:	8th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA 2002)
Held date	:	2002/09
Location (city)	:	Takasaki
Location (country)	:	Japan
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1016/S0168-583X(03)01071-1
DOI for research data	:
Keywords	:	重イオンマイクロビーム・シングルイオンヒットシステム; SEU; 過渡電流特性; 照射損傷; 生成電荷; 収集過程; 炭化珪素P型PNダイオード; イオンの飛程; 空亡層
Research Facility	:	TIARA(イオン照射研究施設)
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:12.48 Category:Instruments & Instrumentation
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Registration No. : B20020533
JAEA Abstracts No. :
Paper Submission No. : 25870

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