A New method to analyze density fluctuation by microwave reflectometry

not registered; Shiraiwa, Shunichi*; Hoshino, Katsumichi; Miura, Yukitoshi; Hanada, Kazuaki*; not registered; JFT-2M Group

no abstracts in English

Language	:	English
Journal	:	Japanese Journal of Applied Physics, Part 1
Volume	:	36
Number	:	12A
Pages	:	p.7367 - 7374
Publication Year/Month	:	1997/12
Meeting title	:
Held date	:
Location (city)	:
Location (country)	:
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1143/JJAP.36.7367
DOI for research data	:
Keywords	:	反射計; プラズマ診断; 密度揺動; 散乱; 複素振幅; JFT-2M; H-mode
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:57.46 Category:Physics, Applied
Altmetrics	:

Registration No. : A19970202
JAEA Abstracts No. : 260218
Paper Submission No. : 15305

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.