Refine your search�ソスF     
Report No.
 - 

Rutherford backscattering/channelling,XRD,XRD pole figure and AES characterization of FeTio$$_{3}$$ thin films prepared in different ambients by laser ablation

Dai, Z.*; Naramoto, Hiroshi; Yamamoto, Shunya; Narumi, Kazumasa; Miyashita, Atsumi

no abstracts in English

Accesses

:

- Accesses

InCites™

:

Percentile:28.69

Category:Physics, Condensed Matter

Altmetrics

:

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.