Characterization of epitaxially grown Cu/Nb multilayer on -Al $_{2}$ O $_{3}$ with RBS/channeling technique

Yamamoto, Shunya; Naramoto, Hiroshi; Tsuchiya, Bun*; Narumi, Kazumasa; Aoki, Yasushi*

no abstracts in English

Language	:	English
Journal	:	Thin Solid Films
Volume	:	335
Number	:	1-2
Pages	:	p.85 - 89
Publication Year/Month	:	1998/00
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Paper URL	:	https://doi.org/10.1016/S0040-6090(98)00948-1
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Keywords	:	多層膜; イオンビーム分析法; エピタキシャル
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Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:50.48 Category:Materials Science, Multidisciplinary
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Registration No. : A19980633
JAEA Abstracts No. : 270365
Paper Submission No. : 16272

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Characterization of epitaxially grown Cu/Nb multilayer on -AlO with RBS/channeling technique

Characterization of epitaxially grown Cu/Nb multilayer on -Al $_{2}$ O $_{3}$ with RBS/channeling technique