Refine your search�ソスF     
Report No.
 - 

ESR studies of defects in P-type 6H-SiC irradiated with 3MeV-electrons

D.Cha*; Ito, Hisayoshi; Morishita, Norio; Kawasuso, Atsuo; Oshima, Takeshi; not registered; J.Ko*; K.Lee*; Nashiyama, Isamu

no abstracts in English

Accesses

:

- Accesses

InCites™

:

Altmetrics

:

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.