Development of a fast multi-parameter data acquisition system for microbeam analyses

Sakai, Takuro; not registered; Hirao, Toshio; Kamiya, Tomihiro; not registered; not registered; Matsuyama, Shigeo*; not registered; Ishii, Keizo*

no abstracts in English

Language	:	English
Journal	:	Nuclear Instruments and Methods in Physics Research B
Volume	:	136-138
Number	:
Pages	:	p.390 - 394
Publication Year/Month	:	1998/00
Meeting title	:	13th International Conference on Ion Beam Analysis (IBA-13)
Held date	:	1997/07
Location (city)	:	Portugal
Location (country)	:
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1016/S0168-583X(97)00862-8
DOI for research data	:
Keywords	:	イオンマイクロビーム; PIXE; RBS; IBIC
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:79.15 Category:Instruments & Instrumentation
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Registration No. : B19970683
JAEA Abstracts No. : 260795
Paper Submission No. : 15765

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