Language |
: | English |
---|---|---|
Journal |
: | |
Volume |
: | 158 |
Number |
: | 1-4 |
Pages |
: | p.255 - 259 |
Publication Year/Month |
: | 1999/00 |
Meeting title |
: | 6th International Conference on Nuclear Microprobe Technology and Applications |
Held date |
: | 1998/10 |
Location (city) |
: | |
Location (country) |
: | South Africa |
Paper URL |
: |
|
Keywords |
: | 重イオンマイクロビーム; 自動ビーム照準; シングルイオン照射; ヒットパターン; 過渡電流; 照射損傷; CR-39; 照射位置精度; Si PINフォトダイオード |
Accesses |
: |
- Accesses |
---|---|---|
InCites™ |
: |
Percentile:46.78 Category:Instruments & Instrumentation |
Altmetrics |
: |
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