Heavy ion beam probe diagnostic system on JFT-2M

Ido, Tsuyoshi*; Hamada, Y.*; not registered; Kawasumi, Y.*; Miura, Yukitoshi; Kamiya, Kensaku*

no abstracts in English

Language	:	English
Journal	:	Review of Scientific Instruments
Volume	:	70
Number	:	1
Pages	:	p.955 - 958
Publication Year/Month	:	1999/01
Meeting title	:	12th Topical Conf. on High-temperature Plasma Diagnostics
Held date	:	1998/06
Location (city)	:	America
Location (country)	:
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1063/1.1149474
DOI for research data	:
Keywords	:	HIBP; JFT-2M; H-mode; Potential Profile; Density Fluctuation; Gas Scattering; Sample Volume
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:84.89 Category:Instruments & Instrumentation
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Registration No. : B19980369
JAEA Abstracts No. : 270949
Paper Submission No. : 16744

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