Electron emission microscope for use in electron emission sites observations

Kobayashi, Shinichi*; not registered; not registered; Saito, Yoshio*; Ogiwara, Norio; R.V.Latham*

no abstracts in English

Language	:	English
Journal	:	Applied Surface Science
Volume	:	146
Number	:	1-4
Pages	:	p.148 - 151
Publication Year/Month	:	1999/00
Meeting title	:	2nd Int. Vacuum Electron Sources Conf.
Held date	:	1998/07
Location (city)	:	つくば
Location (country)	:
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1016/S0169-4332(99)00055-0
DOI for research data	:
Keywords	:	集積型電界放射電子源; 電子顕微鏡; 電子放射サイト
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:8.73 Category:Chemistry, Physical
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Registration No. : B19980646
JAEA Abstracts No. : 271261
Paper Submission No. : 16996

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