SEU testing using cocktail ion beams

Nemoto, N.*; Shindo, Hiroyuki*; not registered; Kuboyama, Satoshi*; Oshima, Takeshi; Ito, Hisayoshi; Nashiyama, Isamu; Matsuda, Sumio*

no abstracts in English

Language	:	English
Journal	:	Proceedings of 3rd International Workshop on Radiation Effects on Semiconductor Devices for Space Application
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Pages	:	p.154 - 159
Publication Year/Month	:	1998/00
Meeting title	:	3rd International Workshop on Radiation Effects of Semiconductor Devices for Space Application
Held date	:	1998/10
Location (city)	:	Takasaki
Location (country)	:	Japan
Patent information	:
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DOI for research data	:
Keywords	:	SEU(シングルイベントアップセット); カクテルイオン; SEUしきい値LET; 飽和反転断面積
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Article of JAEA R&D Review	:
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Registration No. : B19981136
JAEA Abstracts No. : 261058
Paper Submission No. : 15978

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