Characterization of individual particles including lead by combination of SIMS and EPMA

Esaka, Fumitaka ; Watanabe, Kazuo; Magara, Masaaki ; Hanzawa, Yukiko ; Usuda, Shigekazu; Gunji, Katsubumi; Nishimura, Hideo; Adachi, Takeo

no abstracts in English

Language	:	English
Journal	:	Proceedings of 12th International Conference on Secondary Ion Mass Spectrometry (SIMS 12)
Volume	:
Number	:
Pages	:	p.977 - 980
Publication Year/Month	:	2000/00
Meeting title	:	12th International Conference on Secondary Ion Mass Spectrometry (SIMS 12)
Held date	:	1999/09
Location (city)	:	Belgium
Location (country)	:
Patent information	:
PDF	:
Paper URL	:
DOI for research data	:
Keywords	:	エアロゾル; Aerosol; 粒子; Particle; SIMS; EPMA; 同位体比; Isotopic Ratio
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:
Altmetrics	:

Registration No. : B19990073
JAEA Abstracts No. : 290143
Paper Submission No. : 17863

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.