The Irradiation facilities for the radiation tolerance testing of semiconductor devices for space use in Japan

Saido, Masahiro; Fukuda, Mitsuhiro; Arakawa, Kazuo; Tajima, Satoshi; Sunaga, Hiromi; Yotsumoto, Keiichi; Kamiya, Tomihiro; Tanaka, Ryuichi; Hirao, Toshio; Nashiyama, Isamu; Oshima, Takeshi; Ito, Hisayoshi; Okada, Sohei; Nemoto, N.*; Kuboyama, Satoshi*; Matsuda, Sumio*

no abstracts in English

Language	:	English
Journal	:	Proceedings of 1999 IEEE Nuclear and Space Radiation Effects Conference
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Pages	:	p.117 - 122
Publication Year/Month	:	1999/00
Meeting title	:	1999 IEEE Nuclear and Space Radiation Effects Conf.
Held date	:	1999/07
Location (city)	:	America
Location (country)	:
Patent information	:
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DOI for research data	:
Keywords	:	Semiconductor Device for Space; Radiation Tolerance Test; Irradiation Facilities; Total-dose; Single-event; Cocktail-beam
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Article of JAEA R&D Review	:
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Registration No. : B19990134
JAEA Abstracts No. : 280065
Paper Submission No. : 17171

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