Evaluation of scattered neutrons in fast neutron calibration field using $^{252}$ Cf and $^{241}$ Am-Be neutron source

J.R.Dumais*; Yoshizawa, Michio ; Yamaguchi, Yasuhiro

no abstracts in English

Language	:	Japanese
Report No.	:	JAERI-Tech 98-005
Pages	:	65 Pages
Publication Year/Month	:	1998/03
Patent information	:
PDF	:	JAERI-Tech-98-005.pdf:2.32MB
Paper URL	:	https://doi.org/10.11484/jaeri-tech-98-005
Keywords	:	$^{252}$ Cf; $^{241}$ Am-Be; 中性子源; 中性子校正; 散乱中性子; モンテカルロ計算; アンフォールディング; ボナー球検出器
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Registration No. : T19980005
JAEA Abstracts No. : 260299

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Evaluation of scattered neutrons in fast neutron calibration field using Cf and Am-Be neutron source

Evaluation of scattered neutrons in fast neutron calibration field using $^{252}$ Cf and $^{241}$ Am-Be neutron source