Basic study on neutron activation analysis measuring short-lived nuclides (half-lives 0.7 to 100s) using JRR-3M NAA facility

Yonezawa, Chushiro; Ichimura, Shigeju; not registered; Matsue, Hideaki

no abstracts in English

Language	:	Japanese
Report No.	:	JAERI-Tech 98-046
Pages	:	79 Pages
Publication Year/Month	:	1998/11
Patent information	:
PDF	:	JAERI-Tech-98-046.pdf:2.62MB
Paper URL	:	https://doi.org/10.11484/jaeri-tech-98-046
Keywords	:	短寿命核種; 中性子放射化分析; 半減期; 秒オーダー; JRR-3M; 放射化分析設備; 分析感度; 検出限界; フッ素; 窒化ケイ素
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Article of JAEA R&D Review	:
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Registration No. : T19980046
JAEA Abstracts No. : 260980

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