Characteristics of X ray calibration fields for performance test of radiation measuring instruments

not registered; Takahashi, Fumiaki ; Sawahata, Tadahiro*; not registered; not registered; Murayama, Takashi

no abstracts in English

Language	:	Japanese
Report No.	:	JAERI-Tech 99-004
Pages	:	89 Pages
Publication Year/Month	:	1999/02
Patent information	:
PDF	:	JAERI-Tech-99-004.pdf:2.56MB
Paper URL	:	https://doi.org/10.11484/jaeri-tech-99-004
Keywords	:	X線校正場; X線線質条件; X線スペクトル; 線量分布の一様性
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:
Other institute's report number	:

Acecsses	:	- Accesses
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Registration No. : T19990004
JAEA Abstracts No. : 270205

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