Microbeam system for study of single event upset of semiconductor devices

Kamiya, Tomihiro; not registered; Minehara, Eisuke; Tanaka, Ryuichi; Odomari, Iwao*

no abstracts in English

Language	:	English
Journal	:	Nuclear Instruments and Methods in Physics Research B
Volume	:	64
Number	:
Pages	:	p.362 - 366
Publication Year/Month	:	1992/00
Meeting title	:	10th Int. Conf. on Ion Beam Analysis
Held date	:	1991/07
Location (city)	:	Netherlands
Location (country)	:
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1016/0168-583X(92)95495-D
DOI for research data	:
Keywords	:	TIARA; 3MVタンデム加速器; 重イオン; 半導体素子; シングルイベント効果; マイクロビーム装置; マイクロビーム形成; ビーム照準; シングルイオンビット
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:91.05 Category:Instruments & Instrumentation
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Registration No. : B19910325
JAEA Abstracts No. : 200456
Paper Submission No. : 11004

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