Defects in electron-irradiated 3C-SiC epilayers observed by positron annihilation

Ito, Hisayoshi; Yoshikawa, Masahito; Nashiyama, Isamu; L.Wei*; not registered; not registered; Okumura, Hajime*; Yoshida, Sadafumi*

no abstracts in English

Language	:	English
Journal	:	Hyperfine Interactions
Volume	:	79
Number	:
Pages	:	p.725 - 729
Publication Year/Month	:	1993/00
Meeting title	:	International Conference on Hyperfine Interactions
Held date	:	1992/08
Location (city)	:	Osaka
Location (country)	:	Japan
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1007/BF00567599
DOI for research data	:
Keywords	:	シリコンカーバイド; 電子線照射; 欠陥; 陽電子消滅
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:73.57 Category:Physics, Atomic, Molecular & Chemical
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Registration No. : B19920538
JAEA Abstracts No. : 220148
Paper Submission No. : 12204

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