Single ion hit system in heavy ion microbeam apparatus

Kamiya, Tomihiro; not registered; Tanaka, Ryuichi

no abstracts in English

Language	:	Japanese
Journal	:	Dai-3-Kai Ryushisen No Sentanteki Oyo Gijutsu Ni Kansuru Shimpojiumu
Volume	:
Number	:
Pages	:	p.453 - 456
Publication Year/Month	:	1992/00
Meeting title	:	3rd Symp. on Beam of Advanced Materials Synthesis
Held date	:	1992/11
Location (city)	:	東京
Location (country)	:
Patent information	:
PDF	:
Paper URL	:
DOI for research data	:
Keywords	:	宇宙用半導体素子; シングルイベント効果; 重イオンマイクロビーム装置; シングルイオンヒット; ビームサイズ; ビーム照準
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:
Altmetrics	:

Registration No. : B19920927
JAEA Abstracts No. : 210105
Paper Submission No. : 11498

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.