High energy single ion hit system combined with heavy ion microbeam apparatus

Kamiya, Tomihiro; Suda, Tamotsu*; Tanaka, Ryuichi

no abstracts in English

Language	:	English
Journal	:	Nuclear Instruments and Methods in Physics Research B
Volume	:	118
Number	:	1-4
Pages	:	p.423 - 425
Publication Year/Month	:	1996/09
Meeting title	:	12th International Conference on Ion Beam Analysis (IBA-12)
Held date	:	1995/05
Location (city)	:
Location (country)	:	U. S. A.
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1016/0168-583X(95)01090-4
DOI for research data	:
Keywords	:	高分子能元素マッピング; 軽イオンマイクロビーム; ビーム径; ビーム電流; サブミクロン; 電圧安定度; エネルギー分解能; 分析マグネット; 収差; イオン源
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:80.29 Category:Instruments & Instrumentation
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Registration No. : B19950362
JAEA Abstracts No. : 47000833
Paper Submission No. : 21472

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