Low-energy ion source characteristics for producing an ultra-fine microbeam

Ishii, Yasuyuki; Tanaka, Ryuichi; Isoya, Akira*

no abstracts in English

Language	:	English
Journal	:	Nuclear Instruments and Methods in Physics Research B
Volume	:	113
Number	:	1-4
Pages	:	p.75 - 77
Publication Year/Month	:	1996/06
Meeting title	:	European Conference on Accelerators in Applied Research and Technology
Held date	:	1995/08
Location (city)	:	Zrich
Location (country)	:	Switzerland
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1016/0168-583X(95)01308-3
DOI for research data	:
Keywords	:	マクロビーム; 磁気レンズ; 球面収差; 色収差; 超マイクロビーム発生装置; イオン源
Research Facility	:
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Article of JAEA R&D Review	:
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Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:77.77 Category:Instruments & Instrumentation
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Registration No. : B19950793
JAEA Abstracts No. : 47000047
Paper Submission No. : 20740

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