Void fraction effects on stability in cable-in-conduit conductor for varying field due to plasma disruption

Terasawa, Atsumi; Miura, Yushi; Ando, Toshinari; Nozawa, Masanobu*; Isono, Takaaki; Takaya, Yoshiyuki*; Tsuji, Hiroshi; Shimamoto, Susumi

no abstracts in English

Language	:	English
Journal	:	ICEC16/ICMC Proceedings
Volume	:
Number	:
Pages	:	p.1265 - 1268
Publication Year/Month	:	1996/00
Meeting title	:	16th International Cryogenic Engineering Conference/International Cryogenic Materials Conference and Industrial Exhibition; ICEC16/ICMC
Held date	:	1996/05
Location (city)	:	Kitakyushu
Location (country)	:	Japan
Patent information	:
PDF	:
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DOI for research data	:
Keywords	:	Void率; Nb $_{3}$ Sn; CIC導体; プラズマ・ディスラプション; ITER
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Article of JAEA R&D Review	:
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Registration No. : B19960224
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