Radiation effects and surface deformation of silica by ion microbeam

Nishikawa, Hiroyuki*; Souno, T.*; Hattori, M.*; Nishihara, Y.*; Oki, Y.*; Watanabe, E.*; Oikawa, Masakazu*; Kamiya, Tomihiro; Arakawa, Kazuo

no abstracts in English

Language	:	English
Journal	:	Nuclear Instruments and Methods in Physics Research B
Volume	:	191
Number	:	1-4
Pages	:	p.342 - 345
Publication Year/Month	:	2002/05
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Held date	:
Location (city)	:
Location (country)	:
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1016/S0168-583X(02)00530-X
DOI for research data	:
Keywords	:	シリカガラス; イオンマイクロビーム; 顕微フォトルミネッセンス; ラマン分光; 原子間力顕微鏡
Research Facility	:	TIARA(イオン照射研究施設)
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:	早稲田大学

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:24.4 Category:Instruments & Instrumentation
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Registration No. : A20020454
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