Take-off/incident-angle-dependence of / peak intensity ratio in soft X-ray emission and absorption spectra of graphite and hexagonal boron nitride

Muramatsu, Yasuji; Gullikson, E. M.*; Perera, R. C. C.*

Take-off/incident-angle-resolved soft X-ray emission and absorption spectra of highly oriented pyrolytic graphite (HOPG) and hexagonal boron nitride (h-BN) are measured by using polarized synchrotron radiation. The angle-dependent / peak intensity ratio can be explained by the configuration of - and -orbitals, which provides the information of layer ordering in the graphite-like layered materials.

Language	:	Japanese
Journal	:	Advances in X-Ray Chemical Analysis, Japan, 34
Volume	:
Number	:
Pages	:	p.153 - 163
Publication Year/Month	:	2003/00
Meeting title	:
Held date	:
Location (city)	:
Location (country)	:
Patent information	:
PDF	:
Paper URL	:
DOI for research data	:
Keywords	:	放射光; 軟X線; グラファイト; 窒化ホウ素
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:
Altmetrics	:

Registration No. : A20020495
JAEA Abstracts No. : 310574
Paper Submission No. : 20128

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.