Refine your search:     
Report No.
 - 

Postgrowth annealing on defects in ZnO studied by positron annihilation, X-ray diffraction, rutherford backscattering, cathodoluminescence and hall measurements

Chen, Z. Q.; Yamamoto, Shunya; Maekawa, Masaki; Kawasuso, Atsuo; Yuan, X. L.*; Sekiguchi, Takashi*

no abstracts in English

Accesses

:

- Accesses

InCites™

:

Percentile:96.64

Category:Physics, Applied

Altmetrics

:

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.