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Postgrowth annealing on defects in ZnO studied by positron annihilation, X-ray diffraction, rutherford backscattering, cathodoluminescence and hall measurements

Chen, Z. Q.; Yamamoto, Shunya; Maekawa, Masaki; Kawasuso, Atsuo; Yuan, X. L.*; Sekiguchi, Takashi*

no abstracts in English

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Category:Physics, Applied

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