Top most surface studies by total reflection positron diffraction

Kawasuso, Atsuo; Ishimoto, Takayuki*; Fukaya, Yuki ; Hayashi, Kazuhiko; Ichimiya, Ayahiko

no abstracts in English

Language	:	English
Journal	:	e-Journal of Surface Science and Nanotechnology (Internet)
Volume	:	1
Number	:
Pages	:	p.152 - 157
Publication Year/Month	:	2003/12
Meeting title	:	4th International Symposium on Atomic Level Characterizations for New Materials and Devices (ALC '03)
Held date	:	2003/10
Location (city)	:	Hawaii
Location (country)	:	U. S. A.
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1380/ejssnt.2003.152
DOI for research data	:
Keywords	:	陽電子; 回折; 表面; Si-77; SiC
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
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Registration No. : B20030563
JAEA Abstracts No. :
Paper Submission No. : 1139

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