Pulsed EPR studies of shallow donor impurities in SiC

Isoya, Junichi*; Oshima, Takeshi; Morishita, Norio; Kamiya, Tomihiro; Ito, Hisayoshi; Yamasaki, Satoshi*

no abstracts in English

Language	:	English
Journal	:	Physica B; Condensed Matter
Volume	:	340-342
Number	:
Pages	:	p.903 - 907
Publication Year/Month	:	2003/12
Meeting title	:	22nd International Conference on Defects in Semiconductors (ICDS-22)
Held date	:	2003/07
Location (city)	:	Aarhus
Location (country)	:	Denmark
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1016/j.physb.2003.09.097
DOI for research data	:
Keywords	:	パルスEPR; 炭化ケイ素; 浅いドナー不純物; スピン緩和時間
Research Facility	:	TIARA(イオン照射研究施設)
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:	筑波大学

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:51.49 Category:Physics, Condensed Matter
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Registration No. : B20030983
JAEA Abstracts No. : 320632
Paper Submission No. : 21071

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