Chemical-state analysis for low-dimensional Si and Ge films on graphite

Nath, K. G.; Shimoyama, Iwao ; Sekiguchi, Tetsuhiro ; Baba, Yuji

no abstracts in English

Language	:	English
Journal	:	Journal of Applied Physics
Volume	:	94
Number	:	7
Pages	:	p.4583 - 4588
Publication Year/Month	:	2003/10
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Paper URL	:	https://doi.org/10.1063/1.1605253 Read or search this article
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Keywords	:	Silicon; Nanowire; XPS; Cluster; XPS; Graphite; Germanium
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Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:52.39 Category:Physics, Applied
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Registration No. : A20030285
JAEA Abstracts No. : 311029
Paper Submission No. : 20480

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