Deep level transient spectroscopy study of electron-irradiated CuInSe $_{2}$ thin films

Okada, Hiroshi*; Fujita, Naoki*; Lee, H.-S.*; Wakahara, Akihiro*; Yoshida, Akira*; Oshima, Takeshi; Ito, Hisayoshi

no abstracts in English

Language	:	English
Journal	:	Journal of Electronic Materials
Volume	:	32
Number	:	9
Pages	:	p.L5 - L8
Publication Year/Month	:	2003/09
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Paper URL	:	https://doi.org/10.1007/s11664-003-0234-8
DOI for research data	:
Keywords	:	CIS半導体; 電子線照射; DLTS
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Article of JAEA R&D Review	:
Cooperating Institute	:	豊橋技術科学大学

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Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
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Registration No. : A20030540
JAEA Abstracts No. : 320503
Paper Submission No. : 20951

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Deep level transient spectroscopy study of electron-irradiated CuInSe thin films

Deep level transient spectroscopy study of electron-irradiated CuInSe $_{2}$ thin films